发明申请
- 专利标题: HIGH-FREQUENCY MODULE AND METHOD FOR INSPECTING HIGH-FREQUENCY MODULE
- 专利标题(中): 高频模块和检测高频模块的方法
-
申请号: US14130654申请日: 2012-08-22
-
公开(公告)号: US20140159766A1公开(公告)日: 2014-06-12
- 发明人: Suguru Fujita , Ryosuke Shiozaki
- 申请人: Suguru Fujita , Ryosuke Shiozaki
- 申请人地址: JP Osaka
- 专利权人: PANASONIC CORPORATION
- 当前专利权人: PANASONIC CORPORATION
- 当前专利权人地址: JP Osaka
- 优先权: JP2011-189849 20110831
- 国际申请: PCT/JP2012/005264 WO 20120822
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; H01L23/66
摘要:
A high-frequency module includes a high-frequency circuit chip, a wiring board having a wiring unit including connection pads which are flip-chip-connected to input and output terminals of the high-frequency circuit chip via bumps, a measurement circuit element that is disposed on a surface, opposed to the wiring board, of the high-frequency circuit chip and is connected between at least two terminals, connected to connection pads of the wiring unit, of the input and output terminals, or that is disposed on a surface, opposed to the high-frequency circuit chip, of the wiring board and is connected to the connection pads, and a detection conductor that is disposed on the high-frequency circuit chip or the wiring board at such a position as to be opposed to the measurement circuit element.