Invention Application
- Patent Title: X-RAY IMAGING APPARATUS AND X-RAY IMAGE PROCESSING METHOD
- Patent Title (中): X射线成像装置和X射线图像处理方法
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Application No.: US14132935Application Date: 2013-12-18
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Publication No.: US20140185738A1Publication Date: 2014-07-03
- Inventor: Jae Hak LEE , Young Hun SUNG , Kang Eui LEE , Jong Ha LEE , Kwang Eun JANG
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2012-0156254 20121228
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
Disclosed herein is an X-ray imaging apparatus. The X-ray imaging apparatus includes at least one X-ray emitter which is configured to irradiate an object with X-rays at a plurality of X-ray emission positions, an X-ray detector which is configured to detect X-rays which are emitted by the X-ray emitter and to convert the detected X-rays into an electric signal, and an image processor which is configured to acquire a plurality of original X-ray images which respectively correspond to the X-ray emission positions from the generated electric signal and to estimate a virtual X-ray image which is acquirable at an X-ray emission position located between at least two of the plurality of X-ray emission positions, based on at least two of the original X-ray images.
Public/Granted literature
- US09232923B2 X-ray imaging apparatus and X-ray image processing method Public/Granted day:2016-01-12
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