发明申请
- 专利标题: MEASURING INSTRUMENT, MEASUREMENT SYSTEM, MEASUREMENT POSITION POSITIONING METHOD AND MEASUREMENT POSITION POSITIONING PROGRAM USING THE SAME
- 专利标题(中): 测量仪器,测量系统,测量位置定位方法和测量位置使用它的定位程序
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申请号: US14124141申请日: 2012-06-07
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公开(公告)号: US20140185927A1公开(公告)日: 2014-07-03
- 发明人: Hideki Kawabata , Akira Kijima
- 申请人: Hideki Kawabata , Akira Kijima
- 申请人地址: JP Tokyo
- 专利权人: PROSPER CREATIVE CO., LTD.
- 当前专利权人: PROSPER CREATIVE CO., LTD.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2011-127080 20110607
- 国际申请: PCT/JP2012/064700 WO 20120607
- 主分类号: G06T7/40
- IPC分类号: G06T7/40
摘要:
A measurement system is capable of accurately aligning the corresponding measurement points of a plurality of measurement targets to evaluate the measurement targets from measurement results. A measurement system includes a measuring instrument and a PC, the measuring instrument includes a spectroscopic unit that measures a measurement point of a measurement target and a camera that images surroundings in real-time. The PC displays an evaluation image of continuous image information, which is imaged and displayed by the camera on a display screen so as to be superimposed on a reference image of still image information, which has been imaged and stored in memory. By comparing the data obtained by measuring the measurement point in the evaluation image when both images overlap each other and the measurement data of the point in the reference image, it is possible to perform positioning easily and compare the measurement data.
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