发明申请
US20140203798A1 ON-DIE ALL-DIGITAL DELAY MEASUREMENT CIRCUIT 有权
全数字数字延时测量电路

ON-DIE ALL-DIGITAL DELAY MEASUREMENT CIRCUIT
摘要:
An all-digital delay measurement circuit (DMC) constructed on an integrated circuit (IC) die characterizes clocking circuits such as full phase rotation interpolators, also constructed on the IC die. The on-die all-digital DMC produces a digital output value proportional to the relative delay between two clocks, normalized to the clock period of the two clocks.
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