发明申请
US20140209193A1 Charged Particle Beam Instrument 审中-公开
带电粒子束仪

  • 专利标题: Charged Particle Beam Instrument
  • 专利标题(中): 带电粒子束仪
  • 申请号: US14166997
    申请日: 2014-01-29
  • 公开(公告)号: US20140209193A1
    公开(公告)日: 2014-07-31
  • 发明人: Mitsuhide Matsushita
  • 申请人: JEOL Ltd.
  • 优先权: JP2013-13935 20130129
  • 主分类号: H01J37/18
  • IPC分类号: H01J37/18
Charged Particle Beam Instrument
摘要:
A charged particle beam instrument is offered which has a specimen pre-evacuation chamber. An outflow flow rate adjusting valve (70) adjusts the flow rate of gas exhausted from the specimen pre-evacuation chamber (20) under control of controller (82). The controller (82) for making a decision as to whether the difference between a first pressure in the pre-evacuation chamber (20) before the adjusting valve (70) is controlled to the first degree of opening and a second pressure in the pre-evacuation chamber (20) after the adjusting valve (70) has been controlled to the first degree of opening is greater than a first reference value.
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