Invention Application
- Patent Title: HIGH DENSITY PACKAGE INTERCONNECTS
- Patent Title (中): 高密度封装互连
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Application No.: US13977658Application Date: 2011-12-31
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Publication No.: US20140217579A1Publication Date: 2014-08-07
- Inventor: Sanka Ganesan , Zhiguo Qian , Robert L. Sankman , Krishna Srinivasan , Zhaohui Zhu
- Applicant: Sanka Ganesan , Zhiguo Qian , Robert L. Sankman , Krishna Srinivasan , Zhaohui Zhu
- International Application: PCT/US11/68278 WO 20111231
- Main IPC: H01L23/498
- IPC: H01L23/498 ; H01L21/768

Abstract:
Electronic assemblies and methods including the formation of interconnect structures are described. In one embodiment an apparatus includes semiconductor die and a first metal bump on the die, the first metal bump including a surface having a first part and a second part. The apparatus also includes a solder resistant coating covering the first part of the surface and leaving the second part of the surface uncovered. Other embodiments are described and claimed.
Public/Granted literature
- US09368437B2 High density package interconnects Public/Granted day:2016-06-14
Information query
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