Invention Application
US20140217579A1 HIGH DENSITY PACKAGE INTERCONNECTS 有权
高密度封装互连

HIGH DENSITY PACKAGE INTERCONNECTS
Abstract:
Electronic assemblies and methods including the formation of interconnect structures are described. In one embodiment an apparatus includes semiconductor die and a first metal bump on the die, the first metal bump including a surface having a first part and a second part. The apparatus also includes a solder resistant coating covering the first part of the surface and leaving the second part of the surface uncovered. Other embodiments are described and claimed.
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