Invention Application
- Patent Title: PARTICLE DETECTION
- Patent Title (中): 颗粒检测
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Application No.: US14318033Application Date: 2014-06-27
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Publication No.: US20140306113A1Publication Date: 2014-10-16
- Inventor: Ron Knox , Karl Boettger , Kemal Ajay
- Applicant: Xtralis Technologies Ltd
- Assignee: Xtralis Technologies Ltd.
- Current Assignee: Xtralis Technologies Ltd.
- Priority: AU2008902909 20080610; AU2008903268 20080626; AU2008903269 20080626; AU2008903270 20080626; AU2009901923 20090501
- Main IPC: G01N21/49
- IPC: G01N21/49

Abstract:
A particle detection system including; at least one light source adapted to illuminate a volume being monitored at at least two wavelengths; a receiver having a field of view and being adapted to receive light from at least one light source after said light has traversed the volume being monitored and being adapted to generate signals indicative of the intensity of light received at regions within the field of view of the receiver; a processor associated with the receiver adapted to process the signals generated by the receiver to correlate light received at at least two wavelengths in corresponding regions within the field of view of the receiver and generate an output indicative of the relative level of light received at the two wavelengths.
Public/Granted literature
- US09267884B2 Particle detection Public/Granted day:2016-02-23
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