Invention Application
US20140365841A1 SIGNAL PROCESSING SYSTEM WITH BIST FUNCTION, TESTING METHOD THEREOF AND TESTING SIGNAL GENERATOR
有权
具有BIST功能的信号处理系统,其测试方法和测试信号发生器
- Patent Title: SIGNAL PROCESSING SYSTEM WITH BIST FUNCTION, TESTING METHOD THEREOF AND TESTING SIGNAL GENERATOR
- Patent Title (中): 具有BIST功能的信号处理系统,其测试方法和测试信号发生器
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Application No.: US14273985Application Date: 2014-05-09
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Publication No.: US20140365841A1Publication Date: 2014-12-11
- Inventor: Shih-Chieh Yen , Chih-Ming Hung
- Applicant: MStar Semiconductor, Inc.
- Applicant Address: TW Hsinchu Hsien
- Assignee: MStar Semiconductor, Inc.
- Current Assignee: MStar Semiconductor, Inc.
- Current Assignee Address: TW Hsinchu Hsien
- Priority: TW102120298 20130607
- Main IPC: G01R31/3177
- IPC: G01R31/3177

Abstract:
A signal processing system includes a module under test, an oscillation signal generator, a translational filter, and a testing module. The module under test has a signal input end. The oscillation signal generator generates an oscillation signal. The translational filter includes a mixer controlled by the oscillation signals. The mixer has a high-frequency side and a low-frequency side. The high-frequency side is coupled to the signal input end of the module under test. The testing module is coupled to the low-frequency side of the mixer. When the signal processing system is in a testing mode, the testing module provides a testing signal to the low-frequency side, so as to generate a high-frequency testing signal at the high-frequency side of the mixer.
Public/Granted literature
- US09429620B2 Signal processing system with BIST function, testing method thereof and testing signal generator Public/Granted day:2016-08-30
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