Invention Application
- Patent Title: EYEGLASS FRAME SHAPE MEASURING APPARATUS
- Patent Title (中): 眼镜框形状测量装置
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Application No.: US14311666Application Date: 2014-06-23
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Publication No.: US20140373368A1Publication Date: 2014-12-25
- Inventor: Ryoji SHIBATA , Tomoji TANAKA
- Applicant: NIDEK CO., LTD.
- Applicant Address: JP Gamagori
- Assignee: NIDEK CO., LTD.
- Current Assignee: NIDEK CO., LTD.
- Current Assignee Address: JP Gamagori
- Priority: JP2013-131905 20130624; JP2013-131906 20130624
- Main IPC: G02C13/00
- IPC: G02C13/00

Abstract:
There is provided an eyeglass frame shape measuring apparatus includes an eyeglass frame holding unit which holds an eyeglass frame, and a measuring unit which measures a shape of a rim of the eyeglass frame by tracing a contour of the rim of the eyeglass frame. The measuring unit includes a tracing stylus which is inserted into a groove of the rim, a tracing stylus moving unit which moves the tracing stylus in a radial direction of the rim, and a rotating unit which rotates the tracing stylus moving unit about a first axis set to pass through an inside of the contour of the rim such that the tip of the tracing stylus traces the rim along the contour of the rim, and which is disposed on a rear side of the eyeglass frame held by the eyeglass frame holding unit.
Public/Granted literature
- US09535269B2 Eyeglass frame shape measuring apparatus Public/Granted day:2017-01-03
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