Invention Application
US20150010858A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE COMPOSITION USED THEREIN, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE
有权
图案形成方法,使用其的抗紫外线敏感性或辐射敏感性组合物,电阻膜,使用其的电子器件的制造方法和电子器件
- Patent Title: PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE COMPOSITION USED THEREIN, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE
- Patent Title (中): 图案形成方法,使用其的抗紫外线敏感性或辐射敏感性组合物,电阻膜,使用其的电子器件的制造方法和电子器件
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Application No.: US14497462Application Date: 2014-09-26
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Publication No.: US20150010858A1Publication Date: 2015-01-08
- Inventor: Hidenori TAKAHASHI
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM CORPORATION
- Current Assignee: FUJIFILM CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2012-072541 20120327
- Main IPC: G03F7/038
- IPC: G03F7/038

Abstract:
There is provided a pattern forming method comprising (i) a step of forming a film by using an actinic ray-sensitive or radiation-sensitive composition containing (A) a non-polymeric acid-decomposable compound having an aromatic ring and a molecular weight of 500 to 5,000 and (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation; (ii) a step of exposing the film, and (iii) a step of performing development by using an organic solvent-containing developer to form a negative pattern.
Public/Granted literature
Information query
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