Invention Application
- Patent Title: METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING METAL-CONTAINING CONDUCTIVE LINE
- Patent Title (中): 制造包含金属导电线的半导体器件的方法
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Application No.: US14501492Application Date: 2014-09-30
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Publication No.: US20150017797A1Publication Date: 2015-01-15
- Inventor: Jae-hwa PARK , Man-sug KANG , Hee-sook PARK , Woong-hee SOHN
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Priority: KR10-2011-0098308 20110928
- Main IPC: H01L21/768
- IPC: H01L21/768

Abstract:
A semiconductor device includes: a semiconductor substrate having a trench therein, a metal-containing barrier layer extending along an inner wall of the trench and defining a wiring space in the trench, the wiring space having a first width along a first direction, and a metal-containing conductive line on the metal-containing barrier layer in the wiring space, and including at least one metal grain having a particle diameter of about the first width along the first direction.
Information query
IPC分类: