发明申请
US20150054050A1 INTEGRATED SPLIT GATE NON-VOLATILE MEMORY CELL AND LOGIC DEVICE
有权
集成分离栅非易失性存储单元和逻辑器件
- 专利标题: INTEGRATED SPLIT GATE NON-VOLATILE MEMORY CELL AND LOGIC DEVICE
- 专利标题(中): 集成分离栅非易失性存储单元和逻辑器件
-
申请号: US13972372申请日: 2013-08-21
-
公开(公告)号: US20150054050A1公开(公告)日: 2015-02-26
- 发明人: ASANGA H. PERERA , Cheong Min Hong , Sung-Taeg Kang , Janes A. Yater
- 申请人: ASANGA H. PERERA , Cheong Min Hong , Sung-Taeg Kang , Janes A. Yater
- 主分类号: H01L27/115
- IPC分类号: H01L27/115 ; H01L29/66
摘要:
A method of making a semiconductor structure includes forming a select gate and a charge storage layer in an NVM region. A control gate is formed by depositing a conformal layer followed by an etch back. A patterned etch results in leaving a portion of the charge storage layer over the select gate and under the control gate and to remove the charge storage layer from the logic region. A logic gate structure formed in a logic region has a metal work function surrounded by an insulating layer.
公开/授权文献
信息查询
IPC分类: