发明申请
US20150054050A1 INTEGRATED SPLIT GATE NON-VOLATILE MEMORY CELL AND LOGIC DEVICE 有权
集成分离栅非易失性存储单元和逻辑器件

INTEGRATED SPLIT GATE NON-VOLATILE MEMORY CELL AND LOGIC DEVICE
摘要:
A method of making a semiconductor structure includes forming a select gate and a charge storage layer in an NVM region. A control gate is formed by depositing a conformal layer followed by an etch back. A patterned etch results in leaving a portion of the charge storage layer over the select gate and under the control gate and to remove the charge storage layer from the logic region. A logic gate structure formed in a logic region has a metal work function surrounded by an insulating layer.
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