Invention Application
- Patent Title: METHOD AND APPARATUS FOR RANDOM INTERFERENCE MEASUREMENT RESOURCE PATTERN DETERMINATION
- Patent Title (中): 用于随机干扰测量资源模式确定的方法和装置
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Application No.: US14404431Application Date: 2013-05-29
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Publication No.: US20150111505A1Publication Date: 2015-04-23
- Inventor: Youn Sun Kim , Hyo Jin Lee , Ju Ho Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- International Application: PCT/KR2013/004696 WO 20130529
- Main IPC: H04W24/08
- IPC: H04W24/08

Abstract:
A method and apparatus for transmitting feedback information is provided for use in a Cooperative Multi-Point downlink transmission of multiple base stations efficiently. An interference measurement method of a base station in a mobile communication system, the method comprising: allocating at least one Interference Measurement Resource (IMR) to a terminal; transmitting the allocated IMR to the terminal; and receiving at least one channel status information from the terminal; wherein allocating at least one IMR comprises allocating at least one IMR for the terminal overlapped to other IMR for the other terminal.
Public/Granted literature
- US09426684B2 Method and apparatus for random interference measurement resource pattern determination Public/Granted day:2016-08-23
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