Invention Application
- Patent Title: Measurement Method for Object to be Measured
- Patent Title (中): 测量对象的测量方法
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Application No.: US14601284Application Date: 2015-01-21
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Publication No.: US20150129769A1Publication Date: 2015-05-14
- Inventor: Seiji Kamba , Takashi Kondo , Nobuaki Shirai , Toshiki Okada , Makoto Hasegawa
- Applicant: MURATA MANUFACTURING CO., LTD.
- Priority: JP2012-165049 20120725
- Main IPC: G01S17/87
- IPC: G01S17/87

Abstract:
A method for measuring the presence or absence of an object to be measured in a specimen or the quantity thereof. The method includes filtrating the object to be measured from the specimen using as a physical filter, a void-arranged structural body having a plurality of void portions penetrating in a direction perpendicular to a primary surface thereof so as to hold the object to be measured by the void-arranged structural body; irradiating an electromagnetic wave on the void-arranged structural body holding the object to be measured; and detecting characteristics of an electromagnetic wave scattered by the void-arranged structural body.
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