发明申请
US20150143165A1 MEMORY SYSTEMS AND METHODS OF MANAGING FAILED MEMORY CELLS OF SEMICONDUCTOR MEMORIES
有权
存储器系统和管理半导体存储器故障存储器单元的方法
- 专利标题： MEMORY SYSTEMS AND METHODS OF MANAGING FAILED MEMORY CELLS OF SEMICONDUCTOR MEMORIES
- 专利标题（中）： 存储器系统和管理半导体存储器故障存储器单元的方法
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申请号： US14326966申请日： 2014-07-09
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公开(公告)号： US20150143165A1公开(公告)日： 2015-05-21
- 发明人: Sangyeun CHO
- 申请人： SAMSUNG ELECTRONICS CO., LTD.
- 优先权： KR10-2013-0140131 20131118
- 主分类号： G06F11/10
- IPC分类号： G06F11/10
摘要：
A memory system includes a memory controller configured to replace a memory block including a failed memory cell with a unit cache block of a cache memory in response to detection of the failed memory cell in the memory block. The unit cache block is smaller than a minimum size of a memory cell array capable of being blocked by an operating system, and the unit cache block has substantially the same storage capacity as the memory block.
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