Invention Application
- Patent Title: CONTROL APPARATUS AND CONTROL METHOD
- Patent Title (中): 控制装置和控制方法
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Application No.: US14468900Application Date: 2014-08-26
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Publication No.: US20150144766A1Publication Date: 2015-05-28
- Inventor: Hideya TOMITA
- Applicant: NEC Corporation
- Priority: JP2013-244132 20131126
- Main IPC: G01J3/04
- IPC: G01J3/04

Abstract:
A control apparatus includes a slit plate including a plurality of rectangular slits with different widths. The control apparatus also includes an acquisition unit which acquires an incident spectrum from the rectangular slit. The apparatus also includes a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum, and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.
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