A system may include a source of dry ice, a thermal camera, and a computing device. The computing device may be configured to control the source of dry ice to cause dry ice to be introduced into an internal passage of a tested component. The tested component may include debris within the internal passage, and the dry ice may remove at least some of the debris from the internal passage. The computing device also may be configured to receive, from the thermal camera, thermographic image data representative of the thermal response of the tested component and output a representation based on the thermographic image data.