发明申请
US20150166328A1 WAFER LEVEL PACKAGE OF MEMS SENSOR AND METHOD FOR MANUFACTURING THE SAME
审中-公开
MEMS传感器的水平包装及其制造方法
- 专利标题: WAFER LEVEL PACKAGE OF MEMS SENSOR AND METHOD FOR MANUFACTURING THE SAME
- 专利标题(中): MEMS传感器的水平包装及其制造方法
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申请号: US14461937申请日: 2014-08-18
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公开(公告)号: US20150166328A1公开(公告)日: 2015-06-18
- 发明人: Il Seon Yoo , Hi Won Lee , Soon Myung Kwon , Hyun Soo Kim
- 申请人: Hyundai Motor Company
- 优先权: KR10-2013-0158742 20131218
- 主分类号: B81B3/00
- IPC分类号: B81B3/00 ; B81C1/00 ; G01P1/02 ; G01P3/42 ; H01L29/40 ; H01L21/48
摘要:
A MEMS sensor and a manufacturing method thereof is provided: forming a lower electrode layer wherein a metal is deposited on a portion of a lower glass substrate; forming a structural layer by etching according to a pattern which is formed on an upper surface of a silicon wafer and then further etching to the same thickness as the metal which is formed on a portion of the lower electrode layer; anodic bonding the structural layer to an upper portion of the lower electrode layer formed; forming a sensing part in the structural layer by etching according to a pattern which is formed on an opposite surface of the structural layer which is not etched; and forming an upper electrode layer by depositing a metal on an upper wafer and eutectic bonding the upper electrode layer to the structural layer on which the sensing part is formed.
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