Invention Application
- Patent Title: OXIDATION/REDUCTION MEASUREMENT
- Patent Title (中): 氧化/还原测量
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Application No.: US14661906Application Date: 2015-03-18
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Publication No.: US20150192541A1Publication Date: 2015-07-09
- Inventor: Vadim B. Malkov , David Langley Rick
- Applicant: Hach Company
- Main IPC: G01N27/416
- IPC: G01N27/416

Abstract:
Oxidation/reduction measurement is described. An aspect provides an oxidation/reduction quantification method, including: receiving intermittent oxidizer/reducer reference measurements from one or more reference sensors; receiving one or more substantially continuous oxidizer/reducer-related measurements from one or more corroboration sensors; and processing the one or more substantially continuous oxidizer/reducer-related measurements with the intermittent oxidizer/reducer reference measurements to generate substantially continuous representative oxidizer/reducer measurements. Other aspects are described.
Public/Granted literature
- US09927268B2 Oxidation/reduction measurement Public/Granted day:2018-03-27
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