发明申请
US20150241493A1 AUTOMATED ANALYSIS OF RF EFFECTS ON ELECTRONIC DEVICES THROUGH THE USE OF DEVICE UNINTENDED EMISSIONS
有权
通过使用设备意外排放对电子设备进行射频效应的自动分析
- 专利标题: AUTOMATED ANALYSIS OF RF EFFECTS ON ELECTRONIC DEVICES THROUGH THE USE OF DEVICE UNINTENDED EMISSIONS
- 专利标题(中): 通过使用设备意外排放对电子设备进行射频效应的自动分析
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申请号: US14632471申请日: 2015-02-26
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公开(公告)号: US20150241493A1公开(公告)日: 2015-08-27
- 发明人: Karen Heike Spieler Canne , Walter John Keller , Todd Eric Chornenky
- 申请人: Nokomis, INC.
- 申请人地址: US PA Charleroi
- 专利权人: NOKOMIS, INC.
- 当前专利权人: NOKOMIS, INC.
- 当前专利权人地址: US PA Charleroi
- 主分类号: G01R27/32
- IPC分类号: G01R27/32
摘要:
An apparatus, configured and operable to determine a state and/or an operation of a powered electrical device, comprises one or more antennas, a receiver operable to receive emission(s) of electromagnetic energy from the electrical device; an illumination device operable to illuminate the electrical device with a pulse of electromagnetic energy; a controller including: one or more processors, a non-transitory computer readable medium comprising executable instructions that, when executed by the one or more processors, cause the one or more processors to perform the steps of selecting a spectral frequency target component of the emission(s), iteratively controlling the illumination device, measuring, at each iteration, a change in characteristic(s) of the spectral frequency target component of the emission(s), assigning a score value to each measurement, and iteratively effecting optimized parameter(s) of the pulse based on the score value until a final score value indicates a desired state, operation of the electrical device.