发明申请
US20150241493A1 AUTOMATED ANALYSIS OF RF EFFECTS ON ELECTRONIC DEVICES THROUGH THE USE OF DEVICE UNINTENDED EMISSIONS 有权
通过使用设备意外排放对电子设备进行射频效应的自动分析

  • 专利标题: AUTOMATED ANALYSIS OF RF EFFECTS ON ELECTRONIC DEVICES THROUGH THE USE OF DEVICE UNINTENDED EMISSIONS
  • 专利标题(中): 通过使用设备意外排放对电子设备进行射频效应的自动分析
  • 申请号: US14632471
    申请日: 2015-02-26
  • 公开(公告)号: US20150241493A1
    公开(公告)日: 2015-08-27
  • 发明人: Karen Heike Spieler CanneWalter John KellerTodd Eric Chornenky
  • 申请人: Nokomis, INC.
  • 申请人地址: US PA Charleroi
  • 专利权人: NOKOMIS, INC.
  • 当前专利权人: NOKOMIS, INC.
  • 当前专利权人地址: US PA Charleroi
  • 主分类号: G01R27/32
  • IPC分类号: G01R27/32
AUTOMATED ANALYSIS OF RF EFFECTS ON ELECTRONIC DEVICES THROUGH THE USE OF DEVICE UNINTENDED EMISSIONS
摘要:
An apparatus, configured and operable to determine a state and/or an operation of a powered electrical device, comprises one or more antennas, a receiver operable to receive emission(s) of electromagnetic energy from the electrical device; an illumination device operable to illuminate the electrical device with a pulse of electromagnetic energy; a controller including: one or more processors, a non-transitory computer readable medium comprising executable instructions that, when executed by the one or more processors, cause the one or more processors to perform the steps of selecting a spectral frequency target component of the emission(s), iteratively controlling the illumination device, measuring, at each iteration, a change in characteristic(s) of the spectral frequency target component of the emission(s), assigning a score value to each measurement, and iteratively effecting optimized parameter(s) of the pulse based on the score value until a final score value indicates a desired state, operation of the electrical device.
信息查询
0/0