发明申请
US20150245235A1 MEASUREMENT GAP PATTERNS 审中-公开
测量差距图

MEASUREMENT GAP PATTERNS
摘要:
Technology for configuring measurement gap patterns is disclosed. An evolved node B (eNB) can generate multiple measurement gap patterns for a user equipment (UE), wherein each measurement gap pattern indicates at least one set of consecutive subframes within a defined time period during which the UE is to perform inter-frequency measurements for a selected cell. The eNB can configure the multiple measurement gap patterns from the eNB to the UE, the UE being configured to perform the inter-frequency measurements for selected cells within a group of cells according to the multiple measurement gap patterns.
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