Invention Application
US20150253185A1 MEASURING PARALLELISM IN LIGHTGUIDE SURFACES 有权
测量光束表面的平行度

  • Patent Title: MEASURING PARALLELISM IN LIGHTGUIDE SURFACES
  • Patent Title (中): 测量光束表面的平行度
  • Application No.: US14200718
    Application Date: 2014-03-07
  • Publication No.: US20150253185A1
    Publication Date: 2015-09-10
  • Inventor: Evan M. RichardsAnurag Gupta
  • Applicant: Google Inc.
  • Applicant Address: US CA Mountain View
  • Assignee: Google Inc.
  • Current Assignee: Google Inc.
  • Current Assignee Address: US CA Mountain View
  • Main IPC: G01J1/42
  • IPC: G01J1/42 G01J4/04
MEASURING PARALLELISM IN LIGHTGUIDE SURFACES
Abstract:
A system for measuring transparent optical elements includes a beam generator, optomechanics, an imaging module, and a logic unit. The beam generator is driven to emit a beam directed at a transparent optical element that is aligned by optomechanics. An image is captured of the beam after the beam reflects off of surfaces of the transparent optical element. The image is analyzed to measure tolerances of the transparent optical element.
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