Invention Application
US20150276667A1 INTEGRATED CIRCUIT WITH SENSING TRANSISTOR ARRAY, SENSING APPARATUS AND MEASURING METHOD
审中-公开
带感应晶体管阵列的集成电路,感应装置和测量方法
- Patent Title: INTEGRATED CIRCUIT WITH SENSING TRANSISTOR ARRAY, SENSING APPARATUS AND MEASURING METHOD
- Patent Title (中): 带感应晶体管阵列的集成电路,感应装置和测量方法
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Application No.: US14434559Application Date: 2013-10-11
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Publication No.: US20150276667A1Publication Date: 2015-10-01
- Inventor: Johan Hendrik Klootwijk , Marleen Mescher , Pascal De Graaf , Bout Marcelis
- Applicant: KONINKLIJKE PHILIPS N.V.
- International Application: PCT/IB2013/059296 WO 20131011
- Main IPC: G01N27/414
- IPC: G01N27/414 ; H01L29/06 ; H01L29/10 ; H01L29/16

Abstract:
Integrated circuit (100) sensor array, comprising a semiconductor substrate (110); an insulating layer (120) over said substrate; an first transistor (140a) on said insulating layer, the first transistor comprising an exposed functionalized channel region (146a) in between a source region (142a) and a drain region (144) for sensing an analyte in a medium; a second transistor (140b) on said insulating layer, the second transistor comprising an exposed channel region (146b) in between a source region (142b) and a drain region (144) for sensing a potential of said medium; and a voltage bias generator (150) conductively coupled to the semiconductor substrate for providing said transistors with a bias voltage, said voltage bias generator being responsive to the second transistor. A sensing apparatus comprising such an IC and an analyte measurement method using such an IC are also disclosed.
Public/Granted literature
- US10302590B2 Integrated circuit with sensing transistor array, sensing apparatus and measuring method Public/Granted day:2019-05-28
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