Invention Application
- Patent Title: CONDUCTIVE VIA STRUCTURE AND FABRICATION METHOD THEREOF
- Patent Title (中): 导致其结构和制造方法
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Application No.: US14669527Application Date: 2015-03-26
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Publication No.: US20150294938A1Publication Date: 2015-10-15
- Inventor: Yan-Heng Chen , Chun-Tang Lin , Chieh-Yuan Chi , Mu-Hsuan Chan
- Applicant: Siliconware Precision Industries Co., Ltd.
- Priority: TW103113640 20140415
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L23/31 ; H01L23/532

Abstract:
A method for fabricating a conductive via structure is provided, which includes the steps of: forming in an encapsulant a plurality of openings penetrating therethrough; forming a dielectric layer on the encapsulant and in the openings of the encapsulant; forming a plurality of vias in the dielectric layer in the openings of the encapsulant; and forming a conductive material in the vias to thereby form conductive vias. Therefore, by filling the openings having rough wall surfaces with the dielectric layer so as to form the vias having even wall surfaces, the present invention improves the quality of the conductive vias.
Public/Granted literature
- US09607941B2 Conductive via structure and fabrication method thereof Public/Granted day:2017-03-28
Information query
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