Invention Application
US20150301074A1 PHYSICAL QUANTITY DETECTING CIRCUIT, PHYSICAL QUANTITY DETECTION DEVICE, PHYSICAL QUANTITY MEASUREMENT SYSTEM, ELECTRONIC APPARATUS, MOVING OBJECT, AND PHYSICAL QUANTITY MEASUREMENT DATA GENERATION METHOD 审中-公开
物理量检测电路,物理量检测装置,物理量测量系统,电子设备,移动对象和物理量测量数据生成方法

  • Patent Title: PHYSICAL QUANTITY DETECTING CIRCUIT, PHYSICAL QUANTITY DETECTION DEVICE, PHYSICAL QUANTITY MEASUREMENT SYSTEM, ELECTRONIC APPARATUS, MOVING OBJECT, AND PHYSICAL QUANTITY MEASUREMENT DATA GENERATION METHOD
  • Patent Title (中): 物理量检测电路,物理量检测装置,物理量测量系统,电子设备,移动对象和物理量测量数据生成方法
  • Application No.: US14684643
    Application Date: 2015-04-13
  • Publication No.: US20150301074A1
    Publication Date: 2015-10-22
  • Inventor: Takemi YONEZAWAToshiyuki NOZAWA
  • Applicant: Seiko Epson Corporation
  • Priority: JP2014-085775 20140417
  • Main IPC: G01P15/02
  • IPC: G01P15/02
PHYSICAL QUANTITY DETECTING CIRCUIT, PHYSICAL QUANTITY DETECTION DEVICE, PHYSICAL QUANTITY MEASUREMENT SYSTEM, ELECTRONIC APPARATUS, MOVING OBJECT, AND PHYSICAL QUANTITY MEASUREMENT DATA GENERATION METHOD
Abstract:
A physical quantity detecting circuit includes a detection signal generation section adapted to generate a detection signal corresponding to a physical quantity at a first rate based on an output signal of an inertial sensor, an arithmetic processing section adapted to perform arithmetic processing based on the detection signal, a measurement data holding section adapted to hold measurement data based on the detection signal, and a measurement completion flag generation section adapted to generate and then output a measurement completion flag at a second rate lower than the first rate.
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