发明申请
- 专利标题: PHOTOMASK AND PATTERN FORMING METHOD USING PHOTOMASK
- 专利标题(中): 光电子和图案形成方法使用光电子
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申请号: US14798542申请日: 2015-07-14
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公开(公告)号: US20150316841A1公开(公告)日: 2015-11-05
- 发明人: AKIO MISAKA
- 申请人: Panasonic Interllectual Property Management Co., Ltd.
- 优先权: JP2013-008272 20130121
- 主分类号: G03F1/28
- IPC分类号: G03F1/28
摘要:
A photomask includes a transparent substrate, and a light shield provided to the transparent substrate. The light shield includes a translucent mask pattern opening, and the mask pattern opening includes a plurality of translucent regions which are provided to a periphery of a region corresponding to a desired pattern, and allow exposure light beams to be transmitted at at least three different phases. Each of the plurality of translucent region spaced apart from the region corresponding to the desired pattern, advances more toward an exposure object spaced a predetermined distance apart compared to a phase plane of an exposure light beam transmitted through a translucent region of the plurality of translucent regions, the translucent region close to the region corresponding to the desired pattern, such that the exposure light beams that are transmitted through the mask pattern opening form a projection image of the desired pattern on the exposure object.
公开/授权文献
- US09507252B2 Photomask and pattern forming method using photomask 公开/授权日:2016-11-29
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