Invention Application
- Patent Title: NONCONTACT RAPID DEFECT DETECTION OF BARRIER FILMS
- Patent Title (中): 非屏蔽快速检测障碍膜
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Application No.: US14421742Application Date: 2013-09-26
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Publication No.: US20150323458A1Publication Date: 2015-11-12
- Inventor: Jun Amano
- Applicant: Konica Minolta Laboratory U.S.A. Inc.
- Applicant Address: US CA San Mateo
- Assignee: Konica Minolta Laboratory U.S.A. Inc.
- Current Assignee: Konica Minolta Laboratory U.S.A. Inc.
- Current Assignee Address: US CA San Mateo
- International Application: PCT/US2013/062038 WO 20130926
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N21/84 ; G01N21/88

Abstract:
A method of detecting a defect in a barrier film. The method includes: coating the barrier film with a solution having a plurality of probes, where each of the probes has a nanoparticle; forcing a probe of the plurality of probes to penetrate the defect by applying a field to the barrier film, where the field induces an attractive power to the nanoparticles of the probes; applying an optical excitation (OE) to the barrier film; and identifying the defect in the barrier film based on an optical signal emitted, in response to the OE, by the probe forced to penetrate the defect.
Information query