Invention Application
- Patent Title: APPARATUS AND METHOD FOR MEASURING NONLINEAR PARAMETERS
- Patent Title (中): 用于测量非线性参数的装置和方法
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Application No.: US14654647Application Date: 2013-11-04
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Publication No.: US20150323505A1Publication Date: 2015-11-12
- Inventor: Dae Cheol Seo , Seung Hyun Cho , Choon Su Park , Seung Seok Lee , Young Min Seong
- Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Applicant Address: KR Daejeon
- Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Current Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Current Assignee Address: KR Daejeon
- Priority: KR10-2012-0151975 20121224; KR10-2012-0151976 20121224
- International Application: PCT/KR2013/009889 WO 20131104
- Main IPC: G01N29/24
- IPC: G01N29/24 ; G01N29/14
Abstract:
The present invention relates to a technology for measuring a nonlinear parameter of an object to be measured, and more particularly, to an apparatus and method for measuring a nonlinear parameter of an object to be measured.
Public/Granted literature
- US09829469B2 Apparatus and method for measuring nonlinear parameters Public/Granted day:2017-11-28
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