Invention Application
US20150325553A1 Semiconductor Device and Method of Embedding TSV Semiconductor Die Within Substrate for Vertical Interconnect in POP
审中-公开
半导体器件和嵌入TSV半导体晶片的方法,用于垂直互连在POP中
- Patent Title: Semiconductor Device and Method of Embedding TSV Semiconductor Die Within Substrate for Vertical Interconnect in POP
- Patent Title (中): 半导体器件和嵌入TSV半导体晶片的方法,用于垂直互连在POP中
-
Application No.: US14804249Application Date: 2015-07-20
-
Publication No.: US20150325553A1Publication Date: 2015-11-12
- Inventor: DongSam Park , YongDuk Lee
- Applicant: STATS ChipPAC, Ltd.
- Applicant Address: SG Singapore
- Assignee: STATS CHIPPAC, LTD.
- Current Assignee: STATS CHIPPAC, LTD.
- Current Assignee Address: SG Singapore
- Main IPC: H01L25/065
- IPC: H01L25/065 ; H01L23/31 ; H01L23/528 ; H01L23/48

Abstract:
A semiconductor device has a substrate with a first conductive layer over a surface of the substrate and a plurality of cavities exposing the first conductive layer. A first semiconductor die having conductive TSV is mounted into the cavities of the substrate. A first insulating layer is formed over the substrate and first semiconductor die and extends into the cavities to embed the first semiconductor die within the substrate. A portion of the first insulating layer is removed to expose the conductive TSV. A second conductive layer is formed over the conductive TSV. A portion of the first conductive layer is removed to form electrically common or electrically isolated conductive segments of the first conductive layer. A second insulating layer is formed over the substrate and conductive segments of the first conductive layer. A second semiconductor die is mounted over the substrate electrically connected to the second conductive layer.
Information query
IPC分类: