Invention Application
US20150326802A1 X-RAY DETECTING METHOD, PHOTOGRAPHING METHOD USING THE X-RAY DETECTING METHOD, AND X-RAY DETECTOR USING THE METHODS
有权
X射线检测方法,使用X射线检测方法的摄影方法和使用该方法的X射线探测器
- Patent Title: X-RAY DETECTING METHOD, PHOTOGRAPHING METHOD USING THE X-RAY DETECTING METHOD, AND X-RAY DETECTOR USING THE METHODS
- Patent Title (中): X射线检测方法,使用X射线检测方法的摄影方法和使用该方法的X射线探测器
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Application No.: US14685006Application Date: 2015-04-13
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Publication No.: US20150326802A1Publication Date: 2015-11-12
- Inventor: Young KIM , Yongchul Kim , Jaechul Park , Kangho Lee
- Applicant: Samsung Electronics Co., Ltd.
- Priority: KR10-2014-0056572 20140512
- Main IPC: H04N5/359
- IPC: H04N5/359 ; H04N5/32 ; H04N5/378 ; G01T1/16

Abstract:
Provided are methods of detecting X-rays, a photographing methods using the X-ray detecting method and/or an X-ray detector using the methods. For example, one method of detecting X-rays includes radiating a first X-ray, removing, by a first X-ray detection unit, a first electric charge generated by the radiated first X-ray, and outputting, by a second X-ray detection unit adjacent to the first X-ray detection unit, a voltage corresponding to the first X-ray.
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