Invention Application
US20150334584A1 Measurement of a First RAT Based on Metrics of a Second RAT 有权
基于第二RAT的度量的第一RAT的测量

  • Patent Title: Measurement of a First RAT Based on Metrics of a Second RAT
  • Patent Title (中): 基于第二RAT的度量的第一RAT的测量
  • Application No.: US14279412
    Application Date: 2014-05-16
  • Publication No.: US20150334584A1
    Publication Date: 2015-11-19
  • Inventor: Xiantao SunYu-Lin WangZhu JiJohnson O. Sebeni
  • Applicant: Apple Inc.
  • Applicant Address: US CA Cupertino
  • Assignee: Apple Inc.
  • Current Assignee: Apple Inc.
  • Current Assignee Address: US CA Cupertino
  • Main IPC: H04W24/08
  • IPC: H04W24/08
Measurement of a First RAT Based on Metrics of a Second RAT
Abstract:
Performing measurement of a first RAT while connected to a second RAT. The UE may initially communicate with a base station of the second RAT. While maintaining a connection to the base station of the first RAT, the UE may perform base station measurement of the first RAT (e.g., using a single radio of the UE). However, the measurement of the first RAT may be influenced by various factors, such as signal quality metrics of the second RAT. For example, if signal quality metrics are high for the second RAT, measurement of the first RAT may not be desirable, e.g., for battery life reasons.
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