Invention Application
- Patent Title: APPARATUS AND METHOD FOR EXTREME ULTRAVIOLET SPECTROMETER CALIBRATION
- Patent Title (中): 超声波紫外光谱仪校准的装置和方法
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Application No.: US14490948Application Date: 2014-09-19
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Publication No.: US20150346029A1Publication Date: 2015-12-03
- Inventor: Sun Ho KIM , Yong Soo KIM , Jae Hun KIM , Min-Chul PARK , Young Tae BYUN , Min Ah SEO , Joon Mo AHN , Deok Ha WOO , Seok LEE , Taik Jin LEE , Young Min JHON
- Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- Priority: KR10-2014-0065251 20140529
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01J3/28 ; G01J3/10

Abstract:
Disclosed are herein an apparatus and method for extreme ultraviolet (EUV) spectroscope calibration. The apparatus for EUV spectroscope calibration includes an EUV generating module, an Al filter, a diffraction grating, a CCD camera, a spectrum conversion module, and a control module that compares a wavelength value corresponding to a maximum peak among peaks of the spectrum depending on the order of the EUV light converted from the spectrum conversion module with a predetermined reference wavelength value depending on an order of high-order harmonics to calculate a difference value with the closest reference wavelength value, and controls the spectrum depending on the order of the EUV light converted from the spectrum conversion module to be moved in a direction of wavelength axis by the calculated difference value. Thus, it is possible to accurately measure a wavelength of a spectrum of EUV light used in EUV exposure technology and mask inspection technology.
Public/Granted literature
- US09188485B1 Apparatus and method for extreme ultraviolet spectrometer calibration Public/Granted day:2015-11-17
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