发明申请
- 专利标题: X-RAY DIAGNOSTIC APPARATUS
- 专利标题(中): X射线诊断装置
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申请号: US14734105申请日: 2015-06-09
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公开(公告)号: US20150351712A1公开(公告)日: 2015-12-10
- 发明人: Satoru Ohishi
- 申请人: Kabushiki Kaisha Toshiba , Toshiba Medical Systems Corporation
- 申请人地址: JP Minato-ku JP Otawara-shi
- 专利权人: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- 当前专利权人: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- 当前专利权人地址: JP Minato-ku JP Otawara-shi
- 优先权: JP2014-119926 20140610
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
According to one embodiment, an X-ray diagnostic apparatus comprises a first imaging system, a second imaging system, a first support member, a second support member, control circuitry, and a reconstruction circuitry. The first projection data corresponds to a first imaging angle range. The second projection data corresponds to a second imaging angle range. A deficiency angle as an angle at which no imaging is performed is provided between the first imaging angle range and the second imaging angle range to make an imaging angle range in the projection data group have discontinuity.
公开/授权文献
- US10080532B2 X-ray diagnostic apparatus 公开/授权日:2018-09-25
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