Invention Application
US20150359079A1 Etching Apparatus Using Inductively Coupled Plasma 审中-公开
使用电感耦合等离子体的蚀刻装置

  • Patent Title: Etching Apparatus Using Inductively Coupled Plasma
  • Patent Title (中): 使用电感耦合等离子体的蚀刻装置
  • Application No.: US14598313
    Application Date: 2015-01-16
  • Publication No.: US20150359079A1
    Publication Date: 2015-12-10
  • Inventor: Jong-Woo Sun
  • Applicant: SAMSUNG ELECTRONICS CO., LTD.
  • Priority: KR10-2014-0069155 20140609
  • Main IPC: H05H1/00
  • IPC: H05H1/00
Etching Apparatus Using Inductively Coupled Plasma
Abstract:
An etching apparatus may include a chuck, an antenna and a dielectric window. A substrate may be placed on an upper surface of the chuck. The antenna may be arranged over the chuck to form an inductive electromagnetic field between the antenna and the chuck. The dielectric window may be arranged between the antenna and the chuck to transmit the inductive electromagnetic field to the substrate. The dielectric window may have at least two receiving spaces into which an etching gas may be introduced, and a plurality of injecting holes connected to the receiving spaces to inject the etching gas toward the substrate. Thus, the flux or flow rate of the etching gas supplied to the substrate may be selectively controlled.
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