Invention Application
- Patent Title: THERMAL CONDUCTIVITY MEASURING DEVICE
- Patent Title (中): 热导率测量装置
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Application No.: US14861909Application Date: 2015-09-22
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Publication No.: US20160011131A1Publication Date: 2016-01-14
- Inventor: Younghoon HYUN , Young Sam PARK , Moon Gyu JANG , Taehyoung ZYUNG
- Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Priority: KR10-2012-0072351 20120703; KR10-2012-0117228 20121022
- Main IPC: G01N25/18
- IPC: G01N25/18

Abstract:
The inventive concept relates to a thermal conductivity measuring device. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
Public/Granted literature
- US09377420B2 Thermal conductivity measuring device Public/Granted day:2016-06-28
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