Invention Application
- Patent Title: SPECIMEN OBSERVATION DEVICE
- Patent Title (中): 标本观察装置
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Application No.: US14754404Application Date: 2015-06-29
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Publication No.: US20160014343A1Publication Date: 2016-01-14
- Inventor: Yoshihiro KAWANO
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2014-141518 20140709
- Main IPC: H04N5/232
- IPC: H04N5/232 ; G06F3/041 ; H04N5/262

Abstract:
It is possible to readily observe pathology specimens without spending much time and suspected pathology specimens in detail. A specimen observation device comprises an image capturing unit acquiring a partial image representing at least a part of one of multiple pathology specimens mounted on an accommodating section and a whole image of the multiple pathology specimens mounted on the accommodating section; an input unit inputting identification information of the accommodating section; a display unit displaying an enlarged version of the partial image acquired by the image capturing unit); an image designating unit designating the partial image displayed on the display unit; and a storage unit storing the identification information input via the input unit and a position of the partial image designated via the image designating unit in relation to the whole image such that the position and the identification information are associated with the whole image.
Public/Granted literature
- US10129480B2 Specimen observation device Public/Granted day:2018-11-13
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