Invention Application
- Patent Title: COMPUTER-AIDED DIAGNOSIS APPARATUS AND METHOD
- Patent Title (中): 计算机辅助诊断装置和方法
-
Application No.: US14825638Application Date: 2015-08-13
-
Publication No.: US20160048972A1Publication Date: 2016-02-18
- Inventor: Hye Jin KAM , Ha Young KIM , Joo Hyuk JEON
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2014-0106268 20140814
- Main IPC: G06T7/00
- IPC: G06T7/00 ; A61B6/03 ; A61B5/055 ; A61B8/08 ; A61B8/00
Abstract:
A computer-aided diagnosis (CAD) apparatus and method. The CAD apparatus includes an area divider configured to divide a current image frame into a first area and a second area based on location of a region of interest (ROI) detected in a previous image frame. The CAD apparatus further includes a functional processor configured to perform different functions of the CAD apparatus for the first area and the second area.
Public/Granted literature
- US09662040B2 Computer-aided diagnosis apparatus and method Public/Granted day:2017-05-30
Information query
