发明申请
- 专利标题: METHOD FOR IMAGING 1-D NANOMATERIALS
- 专利标题(中): 用于成像1-D纳米材料的方法
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申请号: US14838387申请日: 2015-08-28
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公开(公告)号: US20160061664A1公开(公告)日: 2016-03-03
- 发明人: WEN-YUN WU , JING-YING YUE , XIAO-YANG LIN , QING-YU ZHAO , KAI-LI JIANG , SHOU-SHAN FAN
- 申请人: Tsinghua University , HON HAI PRECISION INDUSTRY CO., LTD.
- 优先权: CN201410434422.X 20140829
- 主分类号: G01J3/44
- IPC分类号: G01J3/44 ; G01N21/64 ; G01N21/65
摘要:
A method for imaging one dimension nanomaterials is provided. Firstly, one dimension nanomaterials sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the one dimensional nanomaterials sample is immersed in the liquid. Thirdly, the one dimensional nanomaterials sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Forthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the one dimensional nanomaterials sample. Fifthly, spectra of the one dimensional nanomaterials sample are measured to obtain chirality of the one dimensional nanomaterials sample.
公开/授权文献
- US10267682B2 Method for imaging 1-D nanomaterials 公开/授权日:2019-04-23
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