发明申请
- 专利标题: SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
- 专利标题(中): 半导体器件及其制造方法
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申请号: US14826811申请日: 2015-08-14
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公开(公告)号: US20160064378A1公开(公告)日: 2016-03-03
- 发明人: Kee Sang KWON , Boun Yoon , Sangjine Park , Myunggeun Song , Ki-Hyung Ko , Jiwon Yun
- 申请人: Kee Sang KWON , Boun Yoon , Sangjine Park , Myunggeun Song , Ki-Hyung Ko , Jiwon Yun
- 优先权: KR10-2014-0116402 20140902
- 主分类号: H01L27/088
- IPC分类号: H01L27/088 ; H01L29/78
摘要:
Semiconductor devices may include a substrate, gate electrodes on the substrate, and source/drain regions at both sides of each of the gate electrodes. Each of the gate electrodes may include a gate insulating pattern on the substrate, a lower work-function electrode pattern that is on the gate insulating pattern and has a recessed upper surface, and an upper work-function electrode pattern that conformally extends on the recessed upper surface of the lower work-function electrode pattern. Topmost surfaces of the lower work-function electrode patterns may be disposed at an equal level, and the upper work-function electrode patterns may have different thicknesses from each other.
公开/授权文献
- US09748234B2 Semiconductor devices and methods of fabricating the same 公开/授权日:2017-08-29
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