Invention Application
US20160064404A1 SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME 有权
半导体结构及其制造方法

  • Patent Title: SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
  • Patent Title (中): 半导体结构及其制造方法
  • Application No.: US14474399
    Application Date: 2014-09-02
  • Publication No.: US20160064404A1
    Publication Date: 2016-03-03
  • Inventor: Erh-Kun Lai
  • Applicant: MACRONIX INTERNATIONAL CO., LTD.
  • Main IPC: H01L27/115
  • IPC: H01L27/115
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
Abstract:
A semiconductor structure and a method for manufacturing the same are provided. The semiconductor structure comprises a substrate, a stack of alternate conductive layers and insulating layers, an opening, an oxide layer and a conductor. The stack is formed on the substrate. The opening penetrates through the stack. The oxide layer is formed on a sidewall of the opening. The conductor is filled into the opening. The conductor is separated from the sidewall of the opening by only the oxide layer.
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