Invention Application
US20160081663A1 METHOD AND SYSTEM FOR AUTOMATED DETECTION AND MEASUREMENT OF A TARGET STRUCTURE
审中-公开
自动检测和目标结构测量的方法和系统
- Patent Title: METHOD AND SYSTEM FOR AUTOMATED DETECTION AND MEASUREMENT OF A TARGET STRUCTURE
- Patent Title (中): 自动检测和目标结构测量的方法和系统
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Application No.: US14489497Application Date: 2014-09-18
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Publication No.: US20160081663A1Publication Date: 2016-03-24
- Inventor: Jixu Chen , Kajoli Banerjee Krishnan
- Applicant: General Electric Company
- Main IPC: A61B8/08
- IPC: A61B8/08 ; A61B5/00 ; A61B8/00 ; G06T7/00

Abstract:
A system and method for imaging a subject are disclosed. A plurality of edge points corresponding to a set of candidate structures are determined in each image frame in a plurality of 3D image frames corresponding to a volume in the subject. A target structure is detected from the set of candidate structures by applying constrained shape fitting to the edge points in each image frame. A subgroup of image frames including the target structure is identified from the 3D frames. A subset of edge points corresponding to the target structure is determined in each of the subgroup of image frames. A plurality of 2D scan planes corresponding to the subset of edge points is determined, and ranked using a determined ranking function to identify a desired scan plane. A diagnostic parameter corresponding to the target structure is measured using a selected image frame that includes the desired scan plane.
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