Invention Application
- Patent Title: METHOD AND APPARATUS FOR PERFORMING RAY-NODE INTERSECTION TEST
- Patent Title (中): 用于执行雷达接收测试的方法和装置
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Application No.: US14690708Application Date: 2015-04-20
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Publication No.: US20160085510A1Publication Date: 2016-03-24
- Inventor: Seokjoong HWANG , Youngsam SHIN , Wonjong LEE , Jaedon LEE
- Applicant: SAMSUNG ELECTRONICS CO., LTD
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2014-0124636 20140918
- Main IPC: G06F7/487
- IPC: G06F7/487 ; G06F5/01

Abstract:
A method and apparatus to perform a ray-node intersection test are provided. The method includes receiving an input representing coordinates of a bounding box and an origin coordinate of a ray as fixed-point numbers, obtaining difference values between the input coordinates of the bounding box and the origin coordinate, and obtaining multiplication values between the obtained difference values and a reciprocal number of a direction vector of the ray, where the reciprocal number is a floating-point number.
Public/Granted literature
- US09830733B2 Method and apparatus for performing ray-node intersection test Public/Granted day:2017-11-28
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