Invention Application
- Patent Title: Differential Current Measurements To Determine Ion Current In The Presence Of Leakage Current
- Patent Title (中): 差分电流测量以确定泄漏电流的离子电流
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Application No.: US14967930Application Date: 2015-12-14
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Publication No.: US20160098909A1Publication Date: 2016-04-07
- Inventor: Joseph Julicher , Keith Curtis , Paul N. Katz
- Applicant: Microchip Technology Incorporated
- Applicant Address: US AZ Chandler
- Assignee: Microchip Technology Incorporated
- Current Assignee: Microchip Technology Incorporated
- Current Assignee Address: US AZ Chandler
- Main IPC: G08B17/113
- IPC: G08B17/113

Abstract:
An ion chamber provides a current representative of its characteristics as affected by external conditions, e.g., clean air or smoke. A direct current (DC) voltage is applied to the ion chamber at a first polarity and the resulting current through the ion chamber and parasitic leakage current is measured at the first polarity, then the DC voltage is applied to the ion chamber at a second polarity opposite the first polarity, and the resulting current through the ion chamber and parasitic leakage current is measured at the second polarity. Since substantially no current flows through the ion chamber at the second polarity, the common mode parasitic leakage current contribution may be removed from the total current measurement by subtracting the current measured at the second polarity from the current measured at the first polarity, resulting in just the current through the ion chamber.
Public/Granted literature
- US09805572B2 Differential current measurements to determine ion current in the presence of leakage current Public/Granted day:2017-10-31
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