Invention Application
- Patent Title: DETECTION OF THE N-QUERIES VIA UNIT TEST
- Patent Title (中): 通过单元测试检测N-QUERIES
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Application No.: US14524776Application Date: 2014-10-27
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Publication No.: US20160117417A1Publication Date: 2016-04-28
- Inventor: Joseph Wong
- Applicant: Joseph Wong
- Main IPC: G06F17/30
- IPC: G06F17/30

Abstract:
In one aspect, there is provided a method. The method may include intercepting a request including one or more select queries sent to a database; generating a parametric form for each of one or more select queries; processing the parametric form to determine whether the one or more select queries cause an n-query issue comprising multiple selects, when executed at the database; and indicating an exception, when the one or more select queries cause the n-query issue. Related systems, methods, and articles of manufacture are also disclosed.
Public/Granted literature
- US09779180B2 Detection of the N-queries via unit test Public/Granted day:2017-10-03
Information query