Invention Application
US20160117417A1 DETECTION OF THE N-QUERIES VIA UNIT TEST 有权
通过单元测试检测N-QUERIES

  • Patent Title: DETECTION OF THE N-QUERIES VIA UNIT TEST
  • Patent Title (中): 通过单元测试检测N-QUERIES
  • Application No.: US14524776
    Application Date: 2014-10-27
  • Publication No.: US20160117417A1
    Publication Date: 2016-04-28
  • Inventor: Joseph Wong
  • Applicant: Joseph Wong
  • Main IPC: G06F17/30
  • IPC: G06F17/30
DETECTION OF THE N-QUERIES VIA UNIT TEST
Abstract:
In one aspect, there is provided a method. The method may include intercepting a request including one or more select queries sent to a database; generating a parametric form for each of one or more select queries; processing the parametric form to determine whether the one or more select queries cause an n-query issue comprising multiple selects, when executed at the database; and indicating an exception, when the one or more select queries cause the n-query issue. Related systems, methods, and articles of manufacture are also disclosed.
Public/Granted literature
Information query
Patent Agency Ranking
0/0