Invention Application
- Patent Title: ULTRA LOW TEMPERATURE DRIFT BANDGAP REFERENCE WITH SINGLE POINT CALIBRATION TECHNIQUE
- Patent Title (中): 超低温标准参考带单点校准技术
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Application No.: US14530448Application Date: 2014-10-31
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Publication No.: US20160124445A1Publication Date: 2016-05-05
- Inventor: Rajeev Jain , Chandrajit Debnath
- Applicant: STMicroelectronics International N.V.
- Main IPC: G05F1/46
- IPC: G05F1/46
Abstract:
A bandgap voltage generator includes a plurality of calibration transistors. A test circuit measures the bandgap reference voltage generated by the bandgap voltage generator and enables a subset of the calibration transistors to correct to the bandgap reference voltage.
Public/Granted literature
- US09851731B2 Ultra low temperature drift bandgap reference with single point calibration technique Public/Granted day:2017-12-26
Information query
IPC分类:
