Invention Application
US20160127074A1 IN-BAND NOISE AND/OR SPECTRAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS
审中-公开
偏置多重信号的带内噪声和/或光谱变形测量
- Patent Title: IN-BAND NOISE AND/OR SPECTRAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS
- Patent Title (中): 偏置多重信号的带内噪声和/或光谱变形测量
-
Application No.: US14931983Application Date: 2015-11-04
-
Publication No.: US20160127074A1Publication Date: 2016-05-05
- Inventor: Gang HE , Daniel GARIEPY
- Applicant: EXFO INC.
- Main IPC: H04J14/06
- IPC: H04J14/06 ; H04B10/079

Abstract:
There is provided a method to discriminate NLE-induced signal deformation from ASE-noise on polarization multiplexed signals, in order to measure the OSNR under NLE conditions and/or characterize the NLE-induced signal deformation. In accordance with one aspect, the method is based on the acquisition of optical spectrum traces when the (data-carrying) optical communication signal is partially or completely extinguished (ASE-noise only), as well as with a live optical communication signal. Comparing traces acquired with different conditions and/or at different dates allows discrimination of the signal contribution, the ASE-noise contribution and the NLE-induced deformations on the SUT.
Public/Granted literature
- US10128975B2 In-band noise and/or spectral deformation measurement on polarization-multiplexed signals Public/Granted day:2018-11-13
Information query