Invention Application
US20160127074A1 IN-BAND NOISE AND/OR SPECTRAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS 审中-公开
偏置多重信号的带内噪声和/或光谱变形测量

  • Patent Title: IN-BAND NOISE AND/OR SPECTRAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS
  • Patent Title (中): 偏置多重信号的带内噪声和/或光谱变形测量
  • Application No.: US14931983
    Application Date: 2015-11-04
  • Publication No.: US20160127074A1
    Publication Date: 2016-05-05
  • Inventor: Gang HEDaniel GARIEPY
  • Applicant: EXFO INC.
  • Main IPC: H04J14/06
  • IPC: H04J14/06 H04B10/079
IN-BAND NOISE AND/OR SPECTRAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS
Abstract:
There is provided a method to discriminate NLE-induced signal deformation from ASE-noise on polarization multiplexed signals, in order to measure the OSNR under NLE conditions and/or characterize the NLE-induced signal deformation. In accordance with one aspect, the method is based on the acquisition of optical spectrum traces when the (data-carrying) optical communication signal is partially or completely extinguished (ASE-noise only), as well as with a live optical communication signal. Comparing traces acquired with different conditions and/or at different dates allows discrimination of the signal contribution, the ASE-noise contribution and the NLE-induced deformations on the SUT.
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