Invention Application
- Patent Title: INPUT/OUTPUT TRACE SAMPLING
- Patent Title (中): 输入/输出跟踪采样
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Application No.: US14555114Application Date: 2014-11-26
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Publication No.: US20160147649A1Publication Date: 2016-05-26
- Inventor: Tariq Magdon-Ismail , Duy Nguyen
- Applicant: VMware, Inc.
- Main IPC: G06F12/02
- IPC: G06F12/02 ; G06F11/30 ; G06F11/34 ; G06F12/08

Abstract:
Exemplary methods, apparatuses, and systems include a host computer selecting a first workload of a plurality of workloads running on the host computer to be subjected to an input/output (I/O) trace. The host computer determines whether to generate the I/O trace for the first workload for a first length of time or for a second length of time. The first length of time is shorter than the second length of time. The determination is based upon runtime history for the first workload, I/O trace history for the first workload, and/or workload type of the first workload. The host computer generates the I/O trace of the first workload for the selected length of time.
Public/Granted literature
- US09471482B2 Input/output trace sampling Public/Granted day:2016-10-18
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