Identifying the dielectric constant and/or the electrical resistivity of part of a geological formation may reveal useful characteristics of the geological formation. This disclosure provides methods, systems, and machine-readable media to determine dielectric constant or electrical resistivity, or both, using contraction mapping. Specifically, contraction mapping may be used with a function of wavenumber k to iteratively solve for values of dielectric constant and electrical resistivity until convergence is achieved. This may allow for convergence to a solution without computing partial derivatives and/or with fewer iterations than previous techniques.