发明申请
US20160171707A1 Realogram Scene Analysis of Images: Superpixel Scene Analysis 有权
图像场景分析:超像素场景分析

  • 专利标题: Realogram Scene Analysis of Images: Superpixel Scene Analysis
  • 专利标题(中): 图像场景分析:超像素场景分析
  • 申请号: US14641290
    申请日: 2015-03-06
  • 公开(公告)号: US20160171707A1
    公开(公告)日: 2016-06-16
  • 发明人: Edward Schwartz
  • 申请人: Edward Schwartz
  • 申请人地址: JP Tokyo
  • 专利权人: RICOH CO., LTD.
  • 当前专利权人: RICOH CO., LTD.
  • 当前专利权人地址: JP Tokyo
  • 主分类号: G06T7/00
  • IPC分类号: G06T7/00 G06K9/00
Realogram Scene Analysis of Images: Superpixel Scene Analysis
摘要:
The techniques include an image recognition system to receive a realogram image including a plurality of organized objects and to detect and identify objects in the realogram image of one or more items on a retail shelf, identify shelf fronts and labels on the shelf fronts, identify empty space under shelves, identify areas where unidentified products may be, and identify areas where products are “out of stock”.
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